Intermodal coupling spectroscopy of mechanical modes in microcantilevers

• Ioan Ignat,
• Bernhard Schuster,
• Jonas Hafner,
• MinHee Kwon,
• Daniel Platz and
• Ulrich Schmid

Beilstein J. Nanotechnol. 2023, 14, 123–132, doi:10.3762/bjnano.14.13

• multitonal responses, from which the force is reconstructed. In this paper, we are building towards a hybrid multifrequency approach different from the ones described above. The on-resonance measurement would follow frequency-modulated AFM or bimodal AFM while being assisted by a new off-resonance excitation

Quantitative dynamic force microscopy with inclined tip oscillation

• Philipp Rahe,
• Daniel Heile,
• Reinhard Olbrich and
• Michael Reichling

Beilstein J. Nanotechnol. 2022, 13, 610–619, doi:10.3762/bjnano.13.53

• appropriate data analysis procedures. We demonstrate these consequences by simulating the frequency shift Δf = fexc − f0 in the frequency-modulated AFM mode for different cases using a Morse potential as a model that describes the interaction between two atoms at a distance d by the parameters Eb = 0.371 aJ

Quantitative determination of the interaction potential between two surfaces using frequency-modulated atomic force microscopy

• Nicholas Chan,
• Carrie Lin,
• Tevis Jacobs,
• Robert W. Carpick and
• Philip Egberts

Beilstein J. Nanotechnol. 2020, 11, 729–739, doi:10.3762/bjnano.11.60

• separation distances. This methodology represents the first experimental technique in which material interaction potential parameters were verified over a range of tip–sample separation distances for a tip apex of arbitrary geometry. Keywords: adhesion; atomic force microscopy; diamond; frequency-modulated

• AFM; interaction potential; Lennard-Jones; surfaces; Introduction Knowledge of material interface interaction behavior is crucial to the design of nanometer-scale devices and processes, such as high-density hard disk storage [1], digital light processing (DLP) projectors [2][3], atomic force

Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

• Aaron Mascaro,
• Yoichi Miyahara,
• Tyler Enright,
• Omur E. Dagdeviren and
• Peter Grütter

Beilstein J. Nanotechnol. 2019, 10, 617–633, doi:10.3762/bjnano.10.62

• used frequency-modulated AFM configuration, the resonance frequency of an oscillating cantilever is measured while the probe tip interacts with a surface [24]. The interactions are purely electrostatic – in other words, the tip and sample form a capacitor. The oscillation of the cantilever can